(LEED), Raman Spectroscopy & Field Ion Microscopy (FIM) techniques for materials characterization at the atomic and molecular level along with composition, and vibration

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this review describes the Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED), Raman Spectroscopy & Field Ion Microscopy (FIM) techniques for materials characterization at the atomic and molecular level along with composition, and vibration frequencies of a substance. The goal is to provide an overview of the utilization of these instrumental methods for analyzing the surfaces of material. Different spectroscopic techniques operate over different frequency ranges within this wide spectrum, depending on the processes and magnitudes of the energy changes. An introduction is presented on the basic principle behind the technique, the operation of the instrument, and the application of the technique.

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تاریخ انتشار 2013